28_nm

28 nm process

The "28 nm" lithography process is a half-node semiconductor manufacturing process based on a die shrink of the "32 nm" lithography process.[1] It appeared in production in 2010.[2]

Since at least 1997, "process nodes" have been named purely on a marketing basis, and have no direct relation to the dimensions on the integrated circuit;[3] neither gate length, metal pitch or gate pitch on a "28nm" device is twenty-eight nanometers.[4][5][6][7]

Taiwan Semiconductor Manufacturing Company has offered "28 nm" production using high-K metal gate process technology.[8]

GlobalFoundries offers a "28nm" foundry process called the "28SLPe" ("28nm Super Low Power") foundry process, which uses high-K metal gate technology.[9]

Design

"28nm" requires twice the number of design rules for ensuring reliability in manufacturing as "80nm".[10]

Shipped devices

AMD's Radeon HD 7970 uses a graphics processing unit manufactured using a "28nm" process.[11]

Some models of the PS3 use a RSX 'Reality Synthesizer' chip manufactured using a "28nm" process.[12]

FPGAs produced with "28 nm" process technology include models of the Xilinx Artix 7 FPGAs and Altera Cyclone V FPGAs.[13]


References

  1. Torres, J. Andres; Otto, Oberdan; Pikus, Fedor G. (2009-10-01). Zurbrick, Larry S.; Montgomery, M. Warren (eds.). Challenges for the 28nm half node: Is the optical shrink dead?. Society of Photographic Instrumentation Engineers. pp. 74882A. doi:10.1117/12.831047.
  2. "A Review of TSMC 28 nm Process Technology | TechInsights". www.techinsights.com. Retrieved 2024-03-01.
  3. Shukla, Priyank. "A Brief History of Process Node Evolution". design-reuse.com. Retrieved 2019-07-09.
  4. Balasinski, Artur (2014). Design for manufacturability: from 1D to 4D for 90-22nm technology nodes. New York, New York: Springer. p. 124. ISBN 978-1-4614-1761-3.
  5. Smith, Ryan. "AMD Radeon HD 7970 Review: 28nm And Graphics Core Next, Together As One". www.anandtech.com. Retrieved 2024-03-01.
  6. Homulle, Harald; Charbon, Edoardo (2017-12-13). "Performance characterization of Altera and Xilinx 28 nm FPGAs at cryogenic temperatures". 2017 International Conference on Field Programmable Technology (ICFPT). IEEE. pp. 25–31. doi:10.1109/FPT.2017.8280117. ISBN 978-1-5386-2656-6.



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