Graphite_ambient_STM.jpg
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Summary
| Description |
Deutsch:
Rastertunnelmikroskopische Aufnahme einer Graphit-Oberfläche, gemessen bei Umgebungsbedingungen (Raumtemperatur, Luft). Zu sehen sind diejenigen Oberflächenatome, die kein unmittelbares Nachbaratom in der nächst unteren Graphitschicht besitzen. Gemessen in Sektion Kristallographie, Dept. Geo/Umwelt,
LMU
München.
English:
Scanning Tunneling Microscopy image of graphite, aquired under ambient conditions. Measured at the Dept. for Earth and Environmental Sciences,
LMU
and
Center for NanoScience (CeNS)
, Munich.
|
| Date | |
| Source | Own work |
| Author | Frank Trixler , Ludwig-Maximilians-Universität München (LMU); adapted from LMU/CeNS: Organic Semiconductor Group |
|
Permission
( Reusing this file ) |
gemeinfrei (public domain) |
Licensing
|
This work has been released into the
public domain
by its author,
I,
Nanotrix
. This applies worldwide.
In some countries this may not be legally possible; if so: I, Nanotrix grants anyone the right to use this work for any purpose , without any conditions, unless such conditions are required by law. |